%0 Journal Article
%T USING THE GENETIC ALGORITHMS TO SOLVE THE PROBLEM OF OPTIMAL SPARE ALLOCATION FOR FAULT-TOLERANT VLSI<br>VLSI冗余单元最优分配的遗传算法求解
%A Zhao Tianxu
%A Hao Yue
%A Zhou Shuisheng
%A <br>赵天绪
%A 郝跃
%A 周水生
%J 电子与信息学报
%D 2001
%I 
%X An increase in chip area and circuit complexity leads to a reduction in the yield of production. In order to solve the problem of low yield by defects in process of large scale integrated circuits manufacture, the fault-tolerant technique is introduced into the integrated circuits design. A system must be provided with a certain quantity of spare elements to have the ability of fault-tolerance. In this paper, the problem of optimal spare allocation for fault-tolerant VLSI is solved effectively by means of genetic algorithm.
%K Genetic algorithm
%K Yield
%K Spare element
%K Fault-tolerant ability<br>遗传算法
%K 最优分配
%K VLSI
%K 冗余单元
%K 集成电路
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=1319827C0C74AAE8D654BEA21B7F54D3&jid=EFC0377B03BD8D0EF4BBB548AC5F739A&aid=2B786FACF72EA639&yid=14E7EF987E4155E6&vid=EA389574707BDED3&iid=CA4FD0336C81A37A&sid=6700D0D256586E73&eid=A4FA325EA800C820&journal_id=1009-5896&journal_name=电子与信息学报&referenced_num=2&reference_num=4