THE EFFECTIVE RANGE OF K-FAULT DIAGNOSIS OF LINEAR CIRCUIT
线性电路K故障诊断法的有效范围

In view of K-fault testability, the topological construction of a practical circuif is far from ideal. In order to improve the testability of a circuit, it is used to increase the number of accessible nodes or to use multi-excitation method. Effectiveness of these methods and feasibility choosing accessible nodes arc discussed in detail. The conditions for multi-excitation testability are presented.