%0 Journal Article
%T THE EFFECTIVE RANGE OF K-FAULT DIAGNOSIS OF LINEAR CIRCUIT<br>线性电路K故障诊断法的有效范围
%A Wu Yao
%A Tong Shihai
%A <br>吴耀
%A 童诗白
%J 电子与信息学报
%D 1989
%I 
%X In view of K-fault testability, the topological construction of a practical circuif is far from ideal. In order to improve the testability of a circuit, it is used to increase the number of accessible nodes or to use multi-excitation method. Effectiveness of these methods and feasibility choosing accessible nodes arc discussed in detail. The conditions for multi-excitation testability are presented.
%K Analog circuit
%K Fault diagnosis
%K K-fault diagnosis
%K Testability<br>模拟电路
%K 故障诊断
%K K故障诊断法
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=1319827C0C74AAE8D654BEA21B7F54D3&jid=EFC0377B03BD8D0EF4BBB548AC5F739A&aid=E6AA3211DBAB762B&yid=1833A6AA51F779C1&vid=708DD6B15D2464E8&iid=0B39A22176CE99FB&sid=A63576421B012172&eid=2B5DE8A23DCEED39&journal_id=1009-5896&journal_name=电子与信息学报&referenced_num=0&reference_num=3