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OALib Journal期刊
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THE APPLICATION OF FIELD ION MICROSCOPE ATOM PROBE FOR MATERIALS SCIENCE
场离子显微镜原子探针在材料科学中的应用

Keywords: ion microscope,atom probe,microstructure
场离子显微镜
,原子探针,微观结构

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Abstract:

The purpose of the present work is to introduce the principlesof field ion microscope-atom probe(FIM-AP)and the results of application tostudy the microstructure of materials.It includes the interaction between hydro-gen and the surface of refractory metal,the absorption and diffusion of hyd-rogen in the austenitic stainless steel,the observation of crystal boundary inthe doped tungsten wires,the short range order of Mo-W alloy and the stud-ies of precipitate phase in the magnetic materials.

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