%0 Journal Article
%T THE APPLICATION OF FIELD ION MICROSCOPE ATOM PROBE FOR MATERIALS SCIENCE<br>场离子显微镜原子探针在材料科学中的应用
%A REN Dagang
%A <br>任大刚
%J 材料研究学报
%D 1989
%I 
%X The purpose of the present work is to introduce the principlesof field ion microscope-atom probe(FIM-AP)and the results of application tostudy the microstructure of materials.It includes the interaction between hydro-gen and the surface of refractory metal,the absorption and diffusion of hyd-rogen in the austenitic stainless steel,the observation of crystal boundary inthe doped tungsten wires,the short range order of Mo-W alloy and the stud-ies of precipitate phase in the magnetic materials.
%K ion microscope
%K atom probe
%K microstructure<br>场离子显微镜
%K 原子探针
%K 微观结构
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=84529CA2B2E519AC&jid=C101C4C04993B4D94FCD8446E6CBEB3B&aid=D95E6A604FC9D051&yid=1833A6AA51F779C1&vid=38B194292C032A66&iid=B31275AF3241DB2D&sid=C81D738643975BB0&eid=2A2AA8B7E19F0DF7&journal_id=1005-3093&journal_name=材料研究学报&referenced_num=0&reference_num=1