Status and Trends in Advanced SOI Devices and Materials

A new method of nanocontact fabrication for Adreev reflection measurement based on the nanopore method using a SiN membrane with focused ion beam technique is presented. With this method, controllable, clean,tensionless nano-contacts for spin polarization probing can be obtained. Measurements of the fabricated samples show complicated spectral structures with a zero bias anomaly and dip structures from quasipartical interactions. A control sample of Co40Fe40B20 is measured with Nb tip method. None of the measured spectra can be explained satisfactorily by present theory. Further analysis of the contact interface and a more complete theory are needed to extract a reliable spin polarization message with the point contact Andreev reflection method.