%0 Journal Article
%T Status and Trends in Advanced SOI Devices and Materials
%A Wang Tianxing
%A Wei Hongxiang
%A Ren Cong
%A Han Xiufeng
%A Clifford E
%A Langford R M
%A Bari M A
%A Coey J M D
%A <br>Wang Tianxing
%A Wei Hongxiang
%A Ren Cong
%A Han Xiufeng
%A Clifford E
%A Langford R M
%A Bari M A
%A Coey J M D
%J 半导体学报
%D 2006
%I 
%X A new method of nanocontact fabrication for Adreev reflection measurement based on the nanopore method using a SiN membrane with focused ion beam technique is presented. With this method, controllable, clean,tensionless nano-contacts for spin polarization probing can be obtained. Measurements of the fabricated samples show complicated spectral structures with a zero bias anomaly and dip structures from quasipartical interactions. A control sample of Co40Fe40B20 is measured with Nb tip method. None of the measured spectra can be explained satisfactorily by present theory. Further analysis of the contact interface and a more complete theory are needed to extract a reliable spin polarization message with the point contact Andreev reflection method.
%K point contact Andreev reflection
%K controllable
%K spin polarization<br>点接触安德鲁反射
%K 可控的
%K 自旋极化
%K point
%K contact
%K Andreev
%K reflection
%K controllable
%K spin
%K polarization
%K 安德鲁
%K 反射
%K 样品
%K 方法
%K Measurements
%K Andreev
%K Reflection
%K Fabrication
%K Method
%K of
%K analysis
%K contact
%K interface
%K complete
%K extract
%K reliable
%K message
%K point
%K contact
%K Andreev
%K reflection
%K spectra
%K present
%K theory
%K control
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=1319827C0C74AAE8D654BEA21B7F54D3&jid=025C8057C4D37C4BA0041DC7DE7C758F&aid=E6F00F50735C99DD&yid=37904DC365DD7266&vid=DB817633AA4F79B9&iid=E158A972A605785F&sid=E543FC2C7CA75C74&eid=0A8675156EB60B87&journal_id=1674-4926&journal_name=半导体学报&referenced_num=0&reference_num=31