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半导体学报 2012
A 14-bit 200-MS/s time-interleaved ADC with sample-time error calibration
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Abstract:
Sample-time error between channels degrades the resolution of time-interleaved analog-to-digital converters (TIADCs). A calibration method implemented in mixed circuits with low complexity and fast convergence is proposed in this paper. The algorithm for detecting sample-time error is based on correlation and widely applied to wide-sense stationary input signals. The detected sample-time error is corrected by a voltage-controlled sampling switch. The experimental result of a 2-channel 200-MS/s 14-bit TIADC shows that the signal-to-noise and distortion ratio improves by 19.1 dB, and the spurious-free dynamic range improves by 34.6 dB for a 70.12-MHz input after calibration. The calibration convergence time is about 20000 sampling intervals.