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OALib Journal期刊
ISSN: 2333-9721
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Total Dose Gamma Irradiation Effects and AnnealingCharacteristics of a SiGe HBT
SiGe HBT 60Co γ射线辐照效应及退火特性

Keywords: SiGe HBT,ionizing radiation,annealing,post-damage effect
SiGe异质结双极晶体管,电离辐射,退火,后损伤效应,SiGe,HBT,γ射线,辐照效应,退火特性,Characteristics,Annealing,Effects,Gamma,Irradiation,Dose,增长,界面态,室温,机理,损伤,结果表现,退化,电流增益,集电极电流,基极电流,显示

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Abstract:

The total-dose radiation effects and annealing characteristics of a SiGe HBT are studied.It is found that the degradation of the current gain is dominated by the increase of Ib.The mechanisms behind the post-damage effects of total-dose radiation are discussed.The chief factor that causes post-damage effects is the increase in the interface states.

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