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OALib Journal期刊
ISSN: 2333-9721
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(NH4)2S treatment of the Si (100) surface and its effects on Al/Si Schottky barrier heights
Si (100) 表面 (NH4)2S 处理及其对Al/Si肖特基势垒的影响

Keywords: 肖特基势垒,硫化铵处理,悬挂键,电流-电压特性

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Abstract:

The effect of Si (100) surface S passivation was investigated. A thick film with a high roughness value was formed on the Si surface treated by (NH4)2S solution, which was attributed to physical adsorption of S atoms. SEM and XPS analyses reveal that Si s

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