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ISSN: 2333-9721
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Mechanism of Reverse Snapback on I-V Characteristics of Power SITHs with Buried Gate Structure
埋栅型电力静电感应晶闸管的I-V特性反向转折机理

Keywords: power static induction thyristor,reverse snapback,electron-hole plasma,lifetime,injection level
电力静电感应晶闸管
,反向转折,电子-空穴等离子体,寿命,注入水平

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Abstract:

The reverse snapback phenomena(RSP)on I-V characteristics of static induction thyristors(SITH)are physically researched.The I-V curves of the power SITH exhibit reverse snapback phenomena,and even turn to the conducting-state,when the anode voltage in the forward blocking-state is increased to a critical value.The RSP I-V characteristics of the power SITH are analyzed in terms of operating mechanism,double carrier injection effect,space charge effect,electron-hole plasma in the channel,and the variation in ...

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