An embeddable SOC real-time prediction technology for TDDB
嵌入式SOC栅氧经时击穿实时预报电路与方法

This paper presents an embeddable SOC real-time prediction circuit and method for TDDB. When the SOC under test is fails due to TDDB, the prediction circuit is capable of issuing a warning signal. The prediction circuit, designed by using a standard CMOS process, occupies a small silicon area and does not share any signal with the circuits under test, therefore, the possibility of interference with the surrounding circuits is safely excluded.