%0 Journal Article
%T An embeddable SOC real-time prediction technology for TDDB<br>嵌入式SOC栅氧经时击穿实时预报电路与方法
%A Xin Weiping
%A Zhuang Yiqi
%A Li Xiaoming
%A <br>辛维平
%A 庄奕琪
%A 李晓明
%J 半导体学报
%D 2012
%I 
%X This paper presents an embeddable SOC real-time prediction circuit and method for TDDB. When the SOC under test is fails due to TDDB, the prediction circuit is capable of issuing a warning signal. The prediction circuit, designed by using a standard CMOS process, occupies a small silicon area and does not share any signal with the circuits under test, therefore, the possibility of interference with the surrounding circuits is safely excluded.
%K TDDB
%K real-time
%K reliability
%K prediction
%K SOC<br>栅氧经时击穿
%K 实时
%K 可靠性
%K 预报
%K 系统级芯片
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=1319827C0C74AAE8D654BEA21B7F54D3&jid=025C8057C4D37C4BA0041DC7DE7C758F&aid=721AF616C5F2DD3E9FC047A8E19DC422&yid=99E9153A83D4CB11&vid=27746BCEEE58E9DC&iid=708DD6B15D2464E8&sid=A934AF033F4A2C78&eid=94C357A881DFC066&journal_id=1674-4926&journal_name=半导体学报&referenced_num=0&reference_num=11