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OALib Journal期刊
ISSN: 2333-9721
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The Convergence Characteristic of the Forward I-V Characteristic Curves of a Semiconductor Silicon Barrier at Different Temperatures
不同温度下半导体硅势垒的正向I-V特性曲线的汇聚特性

Keywords: semiconductor barrier,bandgap,convergent point,forward I-V characteristic curves
半导体势垒
,禁带宽度,汇聚点,正向I-V特性曲线,semiconductor,barrier,bandgap,convergent,point,forward,I-V,characteristic,curves

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Abstract:

The I-V-(T) characteristic curves of p-n junctions with the forward voltage as the independent variable,the logarithm of forward current as the dependent variable,and the junction temperature as the parameter,almost converge at one point in the first quadrant.The voltage corresponding with the convergence point nearly equals the bandgap of the semiconductor material.This convergence point can be used to obtain the I-V characteristic curve at any temperature.

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