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Core-Based Security Chip Design for Test
基于核的信息安全处理芯片可测性设计

Keywords: design for test,core-based design,scan bus,chip test controller
可测性设计
,基于核设计,测试总线,芯片测试控制器

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Abstract:

The design of chip test controller of a security chip and design for test of corresponding cores are discussed in detail.The results of the synthesis show that area overhead of the chip test controller is quite small.

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