%0 Journal Article
%T Core-Based Security Chip Design for Test<br>基于核的信息安全处理芯片可测性设计
%A Lu Sian
%A He Jianchun
%A Yan Xiaolang
%A He Lenian
%A <br>陆思安
%A 何剑春
%A 严晓浪
%A 何乐年
%J 半导体学报
%D 2002
%I 
%X The design of chip test controller of a security chip and design for test of corresponding cores are discussed in detail.The results of the synthesis show that area overhead of the chip test controller is quite small.
%K design for test
%K core-based design
%K scan bus
%K chip test controller<br>可测性设计
%K 基于核设计
%K 测试总线
%K 芯片测试控制器
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=1319827C0C74AAE8D654BEA21B7F54D3&jid=025C8057C4D37C4BA0041DC7DE7C758F&aid=B5CA96E38C01E6FD&yid=C3ACC247184A22C1&vid=EA389574707BDED3&iid=F3090AE9B60B7ED1&sid=1AA557EFF1C6B447&eid=CA10C709B736BBEA&journal_id=1674-4926&journal_name=半导体学报&referenced_num=0&reference_num=5