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半导体学报 1990
X-Ray Double-Crystal Diffraction Study of In_xGa_(1-x)As/GaAs Strained-Layer Superlattice
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Abstract:
A computer simulation method based on X-ray dynamical diffraction theory is presented.The method is used for the analysis of X-ray double-crystal rocking curves of superlattices,The structure parameters of the In_xGa_(1-x)As/GaAs strained-layer superlattice is obtained fromthe simulation of the rocking-curve.