Structure and Characteristics of C60 Thin Films Grown in Argon Atmosphere
在氩气氛下生长的C_(60)薄膜的结构与特性

The surface morphology,structure and optical absorption characteristics of C 60 thin films grown in an argon atmosphere by thermal evaporation are studied by using atomic force microscope,X ray diffraction,infrared spectroscopy and ultraviolet visible optical absorption spectrum.It has been found under an atomic force microscope,the surface particles on C 60 thin films grown in an argon atmosphere are larger and sharper than those in vacuum.Ultraviolet visible optical absorption spectrum for the former,with the wavelength ranging from 200nm to 600nm,is different from that for the latter .The optical bandgap E g is 2 24eV for C 60 thin films grown in argon atmosphere,which is larger than that for C 60 thin films grown in vacuum .IR analysis shows no change observed in a vibrational mode,while XRD reveals a mixture of the face centred cubic and hexagonal close packed phases.