%0 Journal Article
%T Structure and Characteristics of C60 Thin Films Grown in Argon Atmosphere<br>在氩气氛下生长的C_(60)薄膜的结构与特性
%A ZHANG Hai yan
%A CHEN Yi ming
%A WU Chun yan
%A HE Yan yang
%A WANG Jin hua
%A ZHU Yan juan
%A <br>张海燕
%A 陈易明
%A 伍春燕
%A 何艳阳
%A 王金华
%A 朱燕娟
%J 半导体学报
%D 2001
%I 
%X The surface morphology,structure and optical absorption characteristics of C 60 thin films grown in an argon atmosphere by thermal evaporation are studied by using atomic force microscope,X ray diffraction,infrared spectroscopy and ultraviolet visible optical absorption spectrum.It has been found under an atomic force microscope,the surface particles on C 60 thin films grown in an argon atmosphere are larger and sharper than those in vacuum.Ultraviolet visible optical absorption spectrum for the former,with the wavelength ranging from 200nm to 600nm,is different from that for the latter .The optical bandgap E g is 2 24eV for C 60 thin films grown in argon atmosphere,which is larger than that for C 60 thin films grown in vacuum .IR analysis shows no change observed in a vibrational mode,while XRD reveals a mixture of the face centred cubic and hexagonal close packed phases.
%K C 60
%K thin films
%K inert atmosphere
%K ultraviolet
%K visible optical absorption spectrum<br>C60薄膜
%K 惰性气氛
%K 紫外-可见光吸收谱
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=1319827C0C74AAE8D654BEA21B7F54D3&jid=025C8057C4D37C4BA0041DC7DE7C758F&aid=45C8F715C0444A2E&yid=14E7EF987E4155E6&vid=BC12EA701C895178&iid=F3090AE9B60B7ED1&sid=8A87B19A95331EA5&eid=0DC551EE075D9D73&journal_id=1674-4926&journal_name=半导体学报&referenced_num=0&reference_num=15