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半导体学报 2005
Effect of Wafer Surface Morphology Characteristics on Wafer Bonding
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Abstract:
A general wafer bonding criterion is deduced from minimum energy principle,which is developed by linear elastic thin plate theory.Under the same framework the effect of macro-scale wafer bow and micro-scale wafer waviness on wafer bonding process are modeled through the elastic strain energy accumulation rate which is the quantity that controls bonding.Model results are discussed respectively in detail.