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OALib Journal期刊
ISSN: 2333-9721
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Asymmetry LDD MOSFET
非对称轻掺杂漏(LDD)MOSFET

Keywords: LDD MOSFET,Hot-carrier effects,Series resistance
MOSFET
,非对称,掺杂,热载流子,源漏

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Abstract:

A new MOSFET structure-Asymmetry LDD MOSFET,which contains only a lightlydoped buffer region near the drain, has been proposed and fabricated.Asymmetry LDD structure can decrease source-drain series resistance and improve transconductance as comparedwith the conventional LDD MOSFET, keeping the same capability of reducing hot-carrier effects.CMOS ICs consisting of the asymmetry LDD devices exhibit a better performance inspeed.

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