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半导体学报 1991
Analytical Calculation of Avalanche Breakdown Parameters in High-Voltage Diffused p-n Junction
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Abstract:
By using a specialized exponential profile approximation, the analytical expressions ofideal avalanche breakdown parameters for high-voltage diffused p-n junction are found forthe first time. The calculated results coincide well with the full numerical ones obtained by V.A.K. Temple and M.S.Adler and are much more accurate than the results by using one-sidedabrupt and linearly graded profile approximation. The presented method can be used for notonly analysis and design of JTT but also punch-through evaluation in many modern powersemiconductor devices and analytic calculation of the barrier capacitance in diffused p-n ju-nction.