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半导体学报 2000
Proton-Bombarded GaP External Electro-Optic Sampling
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Abstract:
Microwave signals propagating on the indium\|tin oxide coplanar wavegui de were measured by proton\|bombarded GaP external electro\|optic sampling with mu ltiple\|frequency phase\|shift scanning system. Measurements of proton\|bombard ed G aP sample indicate that the resistance value is four orders greater than that of the un\|bombarded. The system is of 40mV/Hz sensitivity as the micro wave frequency is 2.30GHz.