%0 Journal Article
%T Proton-Bombarded GaP External Electro-Optic Sampling<br>质子轰击GaP外部电光采样
%A ZHANG Da
%A |ming
%A TIAN Xiao
%A |jian
%A SUN Wei
%A LI De
%A |hui
%A YI Mao
%A |bin
%A <br>张大明
%A 田小建
%A 孙伟
%A 李德辉
%A 衣茂斌
%J 半导体学报
%D 2000
%I 
%X Microwave signals propagating on the indium\|tin oxide coplanar wavegui de were measured by proton\|bombarded GaP external electro\|optic sampling with mu ltiple\|frequency phase\|shift scanning system. Measurements of proton\|bombard ed G aP sample indicate that the resistance value is four orders greater than that of the un\|bombarded. The system is of 40mV/Hz sensitivity as the micro wave frequency is 2.30GHz.
%K electro\|optic sampling
%K proton bombardment
%K ultrafast optical techniques<br>电光采样
%K 质子轰击
%K 超快光学技术
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=1319827C0C74AAE8D654BEA21B7F54D3&jid=025C8057C4D37C4BA0041DC7DE7C758F&aid=160D6F47841BC0B5&yid=9806D0D4EAA9BED3&vid=659D3B06EBF534A7&iid=9CF7A0430CBB2DFD&sid=C45B504FED793340&eid=9BA5B7BDD4CE0596&journal_id=1674-4926&journal_name=半导体学报&referenced_num=0&reference_num=8