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OALib Journal期刊
ISSN: 2333-9721
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Electronic Structure and Formation of MoSi_2 Silicide
MoSi_2硅化物的形成及电子结构的研究

Keywords: Interfaces,Metal-Semiconductors,Photoemission Spectroscopies
金属
,半导体界面,光电子谱,硅化物

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Abstract:

The properties of electronic structure and formations of MoSi_2 silicide prepared by co-sputtering Mo and Si atoms on silicon substrates under the condition of the steady thermal an-nealing are investigated with the techniques including XPS,UPS,AES,X-ray diffraction andRamman scattering spectroscopy.

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