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系统工程理论与实践 2006
Reliability Analysis of Metallized-film Pulse Capacitor under Competing Failure Modes
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Abstract:
Competing risk involving multiple failures are becoming increasingly common and important in practice.The paper investigates the modeling of competing risk problems involving both traumatic and degradation failures.Dependence of traumatic failure intensities on the degradation level are included into the models.Then,by analyzing degradation mechanism of metallized-film capacitor,this paper presents a life distribution model of metallized-film pulse capacitor using the models.