%0 Journal Article
%T Reliability Analysis of Metallized-film Pulse Capacitor under Competing Failure Modes<br>基于竞争失效模型的金属化膜脉冲电容器产品可靠性研究
%A ZHAO Jian-yin
%A LIU Fang
%A SUN Quan
%A ZHOU Jing-lun
%A <br>赵建印
%A 刘　芳
%A 孙　权
%A 周经伦
%J 系统工程理论与实践
%D 2006
%I 
%X Competing risk involving multiple failures are becoming increasingly common and important in practice.The paper investigates the modeling of competing risk problems involving both traumatic and degradation failures.Dependence of traumatic failure intensities on the degradation level are included into the models.Then,by analyzing degradation mechanism of metallized-film capacitor,this paper presents a life distribution model of metallized-film pulse capacitor using the models.
%K metallized-film pulse capacitor
%K degradation failure
%K competing failure
%K reliability<br>金属化膜脉冲电容器
%K 退化失效
%K 竞争失效
%K 可靠性
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=01BA20E8BA813E1908F3698710BBFEFEE816345F465FEBA5&cid=962324E222C1AC1D&jid=1D057D9E7CAD6BEE9FA97306E08E48D3&aid=9DB2F609553739F5&yid=37904DC365DD7266&vid=96C778EE049EE47D&iid=CA4FD0336C81A37A&sid=BFE7933E5EEA150D&eid=0401E2DB1F51F8DE&journal_id=1000-6788&journal_name=系统工程理论与实践&referenced_num=0&reference_num=7