Progress in Nanoscale Piezoresponse Force Microscopy on Ferroelectrics
铁电材料的纳米尺度压电响应力显微术研究进展

Piezoresponse force microscopy, developed on the base of atomic force microscopy, is a technology of detecting the deflection of the sample surface under alternating electric field according to the converse piezoelectric effect. It has been used to research on nanoscale three-dimensional image of ferroelectric domains, dynamical behavior of domains, control of domain and characterization of local physical properties. This review is involved with the latest progress in piezoresponse force microscopy on ferroelectric materials.