%0 Journal Article
%T Progress in Nanoscale Piezoresponse Force Microscopy on Ferroelectrics<br>铁电材料的纳米尺度压电响应力显微术研究进展
%A YU Han-Feng
%A ZENG Hua-Rong
%A CHU Rui-Qing
%A LI Guo-Rong
%A YIN Qing-rui
%A <br>余寒峰
%A 曾华荣
%A 初瑞清
%A 李国荣
%A 殷庆瑞
%J 无机材料学报
%D 2005
%I Science Press
%X Piezoresponse force microscopy, developed on the base of atomic force microscopy, is a technology of detecting the deflection of the sample surface under alternating electric field according to the converse piezoelectric effect. It has been used to research on nanoscale three-dimensional image of ferroelectric domains, dynamical behavior of domains, control of domain and characterization of local physical properties. This review is involved with the latest progress in piezoresponse force microscopy on ferroelectric materials.
%K piezoresponse force microscopy
%K nanoscale
%K ferroelectric domain
%K local property<br>压电响应力显微术
%K 纳米尺度
%K 铁电畴
%K 微区性能
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=84529CA2B2E519AC&jid=ABC0063016AF57E1C73EF43C8D2212BD&aid=024CD715DCD0E096&yid=2DD7160C83D0ACED&vid=A04140E723CB732E&iid=0B39A22176CE99FB&sid=4290346F7268639E&eid=4FE459D71E3BF8EB&journal_id=1000-324X&journal_name=无机材料学报&referenced_num=0&reference_num=62