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物理学报  2006 

Fabrication and properties of nano metric tunneling junction
纳米隧道结的制备和特性研究

Keywords: atomic force microscope anodic oxidation,titanium oxide line,tunneling junction,Coulomb blockade effect
原子力显微镜阳极氧化
,钛氧化线,隧道结,库仑阻塞效应

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Abstract:

Applicable nano metric titanium-titanium oxide line-titanium tunneling junction was fabricated with dual-facing target sputtering,micro-electronic optical lithography and atomic force microscope anodic oxidation.The thickness of titanium film of the fabricated junction was 3nm and the width of the titanium oxide line was 60.5nm.The I-V curve of the tunneling junction at room temperature clearly indicates the Coulomb blockade effect.

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