Static properties of a femtosecond electron diffraction system
飞秒电子衍射系统的静态特性研究

Ultrafast electron diffraction is an important technique to study the ultrafast phenomenon in physical, chemical and biological processes. This paper introduces a femtosecond electron diffractometer. The diameter of electron beam and deflection sensitivity of X-Y deflection plates are reported. We also demonstrate the static diffraction pattern of a 300 nm thick gold film taken by the femtosecond electron diffractometer.