%0 Journal Article
%T Static properties of a femtosecond electron diffraction system<br>飞秒电子衍射系统的静态特性研究
%A Liu Yun-Quan
%A Liang Wen-Xi
%A Zhang Jie
%A Wu Jian-Jun
%A Tian Jin-Shou
%A Wang Jun-Feng
%A Zhao Bao-Sheng
%A <br>刘运全
%A 梁文锡
%A 张杰
%A 吴建军
%A 田进寿
%A 王俊峰
%A 赵宝升
%J 物理学报
%D 2006
%I 
%X Ultrafast electron diffraction is an important technique to study the ultrafast phenomenon in physical, chemical and biological processes. This paper introduces a femtosecond electron diffractometer. The diameter of electron beam and deflection sensitivity of X-Y deflection plates are reported. We also demonstrate the static diffraction pattern of a 300 nm thick gold film taken by the femtosecond electron diffractometer.
%K femtosecond electron diffraction
%K deflection sensitivity
%K time-resolve
%K spatial-resolve<br>飞秒电子衍射
%K 偏转灵敏度
%K 时间分辨
%K 空间分辨
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=6E709DC38FA1D09A4B578DD0906875B5B44D4D294832BB8E&cid=47EA7CFDDEBB28E0&jid=29DF2CB55EF687E7EFA80DFD4B978260&aid=A0BF16A3D9BE3A3D&yid=37904DC365DD7266&vid=E514EE58E0E50ECF&iid=59906B3B2830C2C5&sid=A69EA7536C843A66&eid=DC05BEBDAC1901EC&journal_id=1000-3290&journal_name=物理学报&referenced_num=4&reference_num=19