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物理学报  2005 

Mechanism of nodule growth in ion beam sputtering films
离子束溅射法薄膜生长中结瘤微缺陷的生长机理

Keywords: nodular defect,zirconium films,diffusion limited aggregation model
结瘤微缺陷,
,锆薄膜,,扩散限制聚集模型

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Abstract:

Zirconium single layer films were prepared by ion beam sputtering method. By using a novel designed substrate holder in pre planting seeds method, the growth process of the nodular defects in thin films was studied. With the help of high resolution optical microscopy and electron scanning microcopy, the phenomenon that the nodules nucleation exhibits fractal characters in their initial growth period was observed. By using the molecular dynamics theory and diffusion limited aggregation model of film growth, the fractal phenomenon of the nodule nucleation was well explained.

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