A new method for directly measuring frequency and intensity temporal profiles of attosecond XUV pulse simultaneously and completely
用光电子能谱相位确定法同时测量阿秒超紫外线XUV脉冲的频率和强度时间分布

A new method of phase determination is presented to measure the frequency and intensity temporal profiles of attosecond XUV pulses directly, simultaneously and completely. Using a cross correlation between femtosecond laser and attosecond X UV, such profiles can be reconstructed from photoelectron energy spectra measure d with two different laser intensities at 0° and 180° with respect to the line ar laser polarization. The method has a temporal measurement range from a quarte r to about half of laser oscillation period. The temporal resolution depends on the jitter and control precision of the laser and XUV pulses. The method can be used for ultra_fast measurement on attosecond time scale.