%0 Journal Article
%T A new method for directly measuring frequency and intensity temporal profiles of attosecond XUV pulse simultaneously and completely<br>用光电子能谱相位确定法同时测量阿秒超紫外线XUV脉冲的频率和强度时间分布
%A Ge Yu-Cheng
%A <br>葛愉成
%J 物理学报
%D 2005
%I 
%X A new method of phase determination is presented to measure the frequency and intensity temporal profiles of attosecond XUV pulses directly, simultaneously and completely. Using a cross correlation between femtosecond laser and attosecond X UV, such profiles can be reconstructed from photoelectron energy spectra measure d with two different laser intensities at 0° and 180° with respect to the line ar laser polarization. The method has a temporal measurement range from a quarte r to about half of laser oscillation period. The temporal resolution depends on the jitter and control precision of the laser and XUV pulses. The method can be used for ultra_fast measurement on attosecond time scale.
%K attosecond measurement
%K photoelectron energy spectrum
%K phase determ ination
%K XUV
%K energy and intensity temporal profiles<br>阿秒测量，
%K 光电子能谱，
%K 相位确定法，
%K 超紫外线，
%K 频率和强度时间分布
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=6E709DC38FA1D09A4B578DD0906875B5B44D4D294832BB8E&cid=47EA7CFDDEBB28E0&jid=29DF2CB55EF687E7EFA80DFD4B978260&aid=E61FA14FFC207635&yid=2DD7160C83D0ACED&vid=318E4CC20AED4940&iid=B31275AF3241DB2D&sid=1B1665F6502C32A4&eid=5FCE9AC7218D4C89&journal_id=1000-3290&journal_name=物理学报&referenced_num=0&reference_num=24