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物理学报 2004
Effect of inner electric field on the photoluminescence spectrum of nanosilicon
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Abstract:
Based on the quantum confinement_luminescence center model, t he relation between the inner electric field (IEF) and the photoluminescence(PL) character is calculated. Results show that the IEF between nanosilicon and lum inescence centers (LCs) can have a strong effect on the carrier recombination ra te and th e spectrum peak position swinging. In the range from 2 to 5 nm, the carrier reco mbination rate at the LCs is much bigger than the rates of recombination inside the nanosilicon. And dut to the presence of IEF between nanosilicon and LCs, the PL intensity at the LCs and inside nanosilicon will reduce remarkably.