MICROSCOPIC OBSERVATION OF DIFFUSION DISTRIBUTION OF IONIZED IMPURITIES IN SILICON
硅中电离杂质扩散分布的显微观测

We present in this paper a microscopic method for revealing the diffusion distribu-tion of ionized impurities in silicon during the oxidizing electrolysis process of water. This method is effective and comparatively simple. The colored micrographs obtained are also included here.