Quadratic Finite Volume Element Method Along Characteristics for the Semiconductor Device of Heat Conduction: H1Error Estimates
热传导型半导体器件的二次元特征有限体积元方法及分析:H1模估计

A fully discrete quadratic finite volume element method along characteristics for the semiconductor device of heat conduction is given, which is used by piecewise lagrange quadratic trial function and piecewise constant test function. Under general conditions, an optimal H1 error estimate is obtained.