%0 Journal Article
%T Quadratic Finite Volume Element Method Along Characteristics for the Semiconductor Device of Heat Conduction: H1Error Estimates<br>热传导型半导体器件的二次元特征有限体积元方法及分析:H1模估计
%A Chen Chuanjun
%A Yuan Yirang
%A <br>陈传军
%A 袁益让
%J 数学物理学报(A辑)
%D 2008
%I 
%X A fully discrete quadratic finite volume element method along characteristics for the semiconductor device of heat conduction is given, which is used by piecewise lagrange quadratic trial function and piecewise constant test function. Under general conditions, an optimal H1 error estimate is obtained.
%K Semiconductorzz
%K Method of characteristicszz
%K Finite volume methodszz
%K Error estimatezz<br>半导体
%K 特征线方法
%K 有限体积元方法
%K 误差估计
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=6E709DC38FA1D09A4B578DD0906875B5B44D4D294832BB8E&cid=37F46C35E03B4B86&jid=4DB553CDB5F521D8C921082E5C95EC80&aid=93BA1BCF53E7860E3EF04758C10FC42C&yid=67289AFF6305E306&vid=D3E34374A0D77D7F&iid=38B194292C032A66&sid=216EFB25F7F834CC&eid=F27A401E323B6FAD&journal_id=1003-3998&journal_name=数学物理学报(A辑)&referenced_num=0&reference_num=0