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OALib Journal期刊
ISSN: 2333-9721
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A new double gate SOI LDMOS with a step doping profile in the drift region
漂移区阶梯掺杂的双栅SOI LDMOS研究

Keywords: SOI,embedded gate,electric field,breakdown voltage,specific on-resistance
SOI,栅极,电场,击穿电压,比导通电阻

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Abstract:

A new double gate SOI LDMOS with a step doping profile in the drift region is proposed. The structure is characterized by one surface gate and another embedded gate under the P-body region. The broadened current flow path and the majority carrier accumula

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