A Simple Method to Determine the Dielectric Constant of Small-Sized Medium-Loss Samples at X-Band Frequencies

An analytical solution for the measurement of dielectric constant of relatively small-sized medium loss samples is formulated in TE011 resonant mode rectangular cavity. Next a simple but ingenious technique based on cavity perturbation techniques in X-band frequencies is presented. The technique is established by using materials having known dielectric constants like p-type silicon. Finally, the technique was applied to study the dielectric constant of wax as a monomer and Ethylene Vinyl Acetate (EVA) as a polymer with carbon loading.