%0 Journal Article
%T A Simple Method to Determine the Dielectric Constant of Small-Sized Medium-Loss Samples at X-Band Frequencies
%J International Journal of Electromagnetics and Applications
%@ 2168-5045
%D 2011
%I 
%R 10.5923/j.ijea.20110101.02
%X An analytical solution for the measurement of dielectric constant of relatively small-sized medium loss samples is formulated in TE011 resonant mode rectangular cavity. Next a simple but ingenious technique based on cavity perturbation techniques in X-band frequencies is presented. The technique is established by using materials having known dielectric constants like p-type silicon. Finally, the technique was applied to study the dielectric constant of wax as a monomer and Ethylene Vinyl Acetate (EVA) as a polymer with carbon loading.
%K Dielectric Constant
%K Microwave Frequencies
%K X-Band
%K Cavity perturbation Method
%U http://article.sapub.org/10.5923.j.ijea.20110101.02.html