Accurate characterization of solar panel materials is essential to optimize their performance, durability, and recyclability. Conventional methods such as X-ray fluorescence, infrared spectroscopy, and X-ray energy-dispersive spectroscopy (EDS) can identify the chemical elements present, but remain costly, complex, and sometimes limited for detailed spatial analysis or access to certain structural information. This work proposes an alternative approach based on texture analysis by Gabor filter applied to images of photovoltaic modules. This method allows to quickly identify and distinguish the different components of solar panels. The study consisted of applying the Gabor filter to images of crystalline silicon panels in order to identify the main materials present and to evaluate their spatial distribution. The results show that the measured distances are below the threshold of 0.056, indicating a strong similarity between the analyzed powders and known references. The elements Si, Ag, Cu, CaO, Na2O and SiO2 were identified in the segmented regions, confirming the reliability of the textural approach for the analysis of photovoltaic materials. This method reduces analysis time and the need for specialized equipment, opening up prospects for better end-of-life management and optimization of photovoltaic panel recycling processes.
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