Growth And Characterization CdO:Ag Thin Films By SILAR Technique

In the study, Ag-doped CdO thin films were grown on the microscopic glass surface by SILAR method at room temperature. The structural, optical and morphological properties of the grown film were investigated. XRD device was used in the structural investigation, XRD results show that the samples have polycrystalline cubic structure and the average crystal sizes have been shown rising from 22 nm to 25 nm with Ag dopant. The absorbance measurements show that the band gap increase from 2.22 eV to 2.67 eV with the increasing Ag dopant ratio. SEM images show that the changing Ag dopant ratio causes the significant changing in the surface of samples