Long-Range Charge Extraction in Back-Contact Perovskite Architectures via Suppressed Recombination

？ Back-contact device efficiency is driven by majority carrier diffusion ？ Electrode-induced spatial segregation of charge carriers increases diffusion range ？ Diffusion lengths exceed 12 μm in thin-film back-contact architecture devices ？ Electron diffusivity is twice that of holes for polycrystalline MAPbI3 film