1/f spectrum estimation based on α

The main goal of this paper is to suppress the effect of unavoidable colored Gaussian noise on declining accuracy of transistor 1/f spectrum estimation. Transistor noises are measured by a nondestructive cross-spectrum measurement method, which is first to amplify the voltage signals through ultra-low noise amplifiers, then input the weak signals into data acquisition card. The data acquisition card collects the voltage signals and outputs the amplified noise for further analysis. According to our studies, the output 1/f noise can be characterized more accurately as non-Gaussian α-stable distribution rather than Gaussian distribution. Therefore, by utilizing the properties of α-stable distribution, we propose a cross-spectrum method effective in noisy environments based on samples normalized cross-correlation function. Simulation results and diodes output noise spectrum estimation results confirm the effectiveness of our method