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In the past, 1/f noise was regarded as a stochastic process that accords with Gaussian distribution. According to our studies, the output transistor 1/f noise can be characterized more accurately as non-Gaussian α-stable distribution rather than Gaussian distribution. We define and consistently estimate the samples normalized cross-correlations of linear SαS processes and propose a samples normalized cross-correlations–based α-spectrum method effective in noisy environments. Simulation results and diodes noise spectrum estimation results exhibit good performance