全部 标题 作者
关键词 摘要

OALib Journal期刊
ISSN: 2333-9721
费用:99美元

查看量下载量

相关文章

更多...

High brightness ultrafast transmission electron microscope based on a laser-driven cold-field emission source: principle and applications

DOI: https://doi.org/10.1080/23746149.2019.1660214

Full-Text   Cite this paper   Add to My Lib

Abstract:

ABSTRACT We report on the development of an ultrafast Transmission Electron Microscope based on a laser-driven cold-field emission source. We first describe the instrument before reporting on numerical simulations of the laser-driven electron emission. These simulations predict the temporal and spectral properties of the femtosecond electron pulses generated in our ultrafast electron source. We then discuss the effects that contribute to the spatial, temporal and spectral broadening of these electron pulses during their propagation from the electron source to the sample and finally to the detectors of the electron microscope. The spectro-temporal properties are then characterized in an electron/photon cross-correlation experiment based on the detection of electron energy gains. We finally illustrate the potential of this instrument for ultrafast electron holography and ultrafast electron diffraction. Graphical Abstrac

Full-Text

Contact Us

service@oalib.com

QQ:3279437679

WhatsApp +8615387084133