强电磁脉冲辐照屏蔽舱结构电子系统的效应仿真
Simulation of the High Power Electromagnetic Pulse Radiation Effect on a Shielded Electronic System

DOI: 10.12677/OE.2019.93020, PP. 141-151

Keywords: 电磁拓扑，电子系统，电磁效应评估，仿真
Electromagnetic Topology, Electronic System, Electromagnetic Effect Evaluation, Simulation

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Abstract:

本文针对高强度辐射电磁场所形成的复杂电磁环境对电子系统形成的电磁威胁以及电子系统本身的电磁辐射源引起的电磁兼容性问题，运用电磁拓扑的理论与技术，仿真计算在外加辐射场以不同的重复频率、脉宽、入射方向和极化方向入射时，屏蔽腔体内部单线和同轴线缆终端的感应电流和感应电压。仿真计算结果表明，以脉冲平面波入射的强电磁脉冲在系统内产生的感应电流可能对屏蔽舱的电子设备造成干扰和破坏。
Aiming at the electromagnetic threat to the electronic system caused by the complex electromag-netic environment formed by the high intensity radiation electromagnetic field and the electro-magnetic compatibility problem caused by the electromagnetic radiation source of the electronic system itself, using the theory and technology of electromagnetic topology, the inductive current and inductive voltage of the single-wire and coaxial cable terminals in the shielding cavity are calculated by simulation when the external radiation field is incident with different repetition frequency, incident direction and polarization direction. The results show that inducted current of electronic device set in the shielding cavity by incident plane wave electromagnetic pulses may cause the confusion and damage of the electronic device and terminal equipment.

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