静电放电引发嵌入式软件故障的等效实验预测方法
Equivalent Experiments Based Prediction Methods for Embedded Software Error due to Electrostatic Discharge

对于电子设备的正常运行，静电放电有时是一种严重威胁。目前，由静电放电造成的大多数硬件故障问题可以在产品设计阶段进行规避。但静电放电引发的嵌入式软件故障，因其偶发性、突发性、隐蔽性等特点，依然是一项业界难题。将目前发现的嵌入式软件故障进行分类，并提出了一系列软件故障的等效实验监测方法。通过方法探究和大量实验佐证，力图从这些监测方法中寻求静电放电引发嵌入式软件故障的等效实验预测方法。
Electrostatic discharge (ESD) related embedded software error is a critical issue for electronic products and is hard to discover in the early stage of product development. This paper categorizes different embedded software errors at first, and then presents several detection methods to find precursors of these software errors. By discussing the methodology, the applicability of each method is given, in terms of application scenarios and limitations